The advanced electron microscope of Sergei Matveev

Sergei Matveev is postdoc researcher at the Geolab and works with the latest advanced ultrahigh resolution scanning electron microscope at the David de Wied Building    

Who are you and what do you do?
My name is Sergei Matveev, researcher (postdoc) at the Structural Geology Group and Geolab (Department of Earth Sciences, Faculty of Geosciences). I have shared responsibilities to perform research and operate dual beam (ion and electron) scanning microscope FEI Helios NanoLab G3 UC  (shown) as well as the field emission electron probe microanalyzer JEOL 8530F (available at the Geolab, Castel). I am working on new techniques and applications for micro and nanoscale quantitative analysis in geology and material sciences and assist operation of electron beam equipment.

Where is this workplace?
This FIB – SEM (Focussed Ion Beam – Scanning Electron Microscope) FEI Helios NanoLab G3 UC is recently  installed (September 2015) at the David de Wiedgebouw. The instrument is a part of the electron microscopy center 'EM Square', Utrecht University, which is interdisciplinary national facility with principal investigators from Biology, Chemistry and Geology Departments.

What is special about this workplace or about your research?
FEI Helios NanoLab G3 UC -  is the latest advanced ultrahigh resolution scanning electron microscope and precise nanoscale ion beam milling tool. This instrument is equipped with a wide array of detectors for electron microscopy  (secondary and backscattered electron imaging, electron backscatter diffraction, cathode luminescence, energy dispersive spectrometer for chemical analysis).

It is used for high resolution electron imaging, 3D tomography (slice and view method), sample preparation for transmitting electron microscopy (TEM lamella lift out) and high resolution quantitative analysis of solids. In addition the instrument is equipped with a cryostage, which allows to study frozen samples (e.g. biological samples, water ice). I am using this advanced instrument to study structures and compositions of minerals and rocks at micrometer and nanometer scale, pushing the limits of analytical methods applied in geology.

De werkplek
on 19/01/2016

Sergei Matveev is postdoc researcher at the Geolab and works with the latest advanced ultrahigh resolution scanning electron microscope at the David de Wied Building    

Who are you and what do you do?
My name is Sergei Matveev, researcher (postdoc) at the Structural Geology Group and Geolab (Department of Earth Sciences, Faculty of Geosciences). I have shared responsibilities to perform research and operate dual beam (ion and electron) scanning microscope FEI Helios NanoLab G3 UC  (shown) as well as the field emission electron probe microanalyzer JEOL 8530F (available at the Geolab, Castel). I am working on new techniques and applications for micro and nanoscale quantitative analysis in geology and material sciences and assist operation of electron beam equipment.

Where is this workplace?
This FIB – SEM (Focussed Ion Beam – Scanning Electron Microscope) FEI Helios NanoLab G3 UC is recently  installed (September 2015) at the David de Wiedgebouw. The instrument is a part of the electron microscopy center 'EM Square', Utrecht University, which is interdisciplinary national facility with principal investigators from Biology, Chemistry and Geology Departments.

What is special about this workplace or about your research?
FEI Helios NanoLab G3 UC -  is the latest advanced ultrahigh resolution scanning electron microscope and precise nanoscale ion beam milling tool. This instrument is equipped with a wide array of detectors for electron microscopy  (secondary and backscattered electron imaging, electron backscatter diffraction, cathode luminescence, energy dispersive spectrometer for chemical analysis).

It is used for high resolution electron imaging, 3D tomography (slice and view method), sample preparation for transmitting electron microscopy (TEM lamella lift out) and high resolution quantitative analysis of solids. In addition the instrument is equipped with a cryostage, which allows to study frozen samples (e.g. biological samples, water ice). I am using this advanced instrument to study structures and compositions of minerals and rocks at micrometer and nanometer scale, pushing the limits of analytical methods applied in geology.

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